BL-02: Engineering Applications beamline

Beamline overview

This beamline utilizes X-ray diffraction (XRD) technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz; stress measurement, texture measurement, micro structure and elastic constants determination in variety of bulk as well as thinfilm samples. The flexible design of beamline allows various types of X-ray scattering experiments such as grazing angle diffraction, X-ray reflectivity and energy dispersive XRD. Additionally, the beamline has insitu high temperature (up to 900 K) facility with vacuum (better than 5×10-5 mbar) environment. The facility for insitu XRD during mechanical loading will be added soon.

This beamline enables a wide range of experiments:

  1. Residual stress measurements in thinfilms and bulk samples
  2. Powder diffraction, line profile analysis
  3. Energy dispersive XRD
  4. X-ray reflectivity, Resonant X-ray reflectivity
  5. High resolution XRD for epitaxial thin films
  6. High temperature (Room Temperature to ~900 K) and Low Temperature XRD measurements down to ~100 K
  7. X-ray absorption near edge spectroscopy (XANES)
  8. Anomalous X-ray diffraction
  9. Grazing incidence X-ray diffraction (GIXRD)

Beamline parameters & Optical layout

BL-02 PARAMETERS
Energy Range5-25 keV (Monochromatic mode)
5-40 keV (White beam mode)
Flux~1x109 ph/s @12 keV
Resolving power1.5 eV @ 10 keV
Beam Size0.5-8.0 mm (H) Χ 0.3 mm (V)
MonochromatorSi (111) Double Crystal Monochromator
Schematic layout of the engineering application beamline (not to the scale)
Schematic layout of the engineering application beamline (not to the scale)

Experimental station

A high-precision open Eulerian cradle six-circle Huber diffractometer :

Can accommodate a sample up to ~15 kg weight, has sphere of confusion of 50 μm for all axis movement.

Can handle a sample size up to: 1000 mm (L), 500 mm (W) and 45 mm thickness.

Allows a high 2θ range up to 170 deg. with a step size accuracy of 0.0002 deg.

Experimental station
Available Detectors

2D PSD with ~6 deg coverage and pixel size of~0.016 deg
1D PSD with ~3.5 deg coverage and pixel size of ~0.003 deg
2D PSD with ~6 deg coverage and pixel size of~0.016 deg
1D PSD with ~3.5 deg coverage and pixel size of ~0.003 deg


Energy range 5 -35 keV
Resolution 122 eV FWHM at 5.9 keV, 
Count rates > 1,000,000 CPS


Energy range 5 -300 keV
Resolution 550 eV FWHM at 122 keV, 
Count rates > 50,000 CPS
Energy range 5 -35 keV Resolution 122 eV FWHM at 5.9 keV, Count rates > 1,000,000 CPS
Energy range 5 -300 keV Resolution 550 eV FWHM at 122 keV, Count rates > 50,000 CPS



Heating-cooling stages
Energy range 5 -35 keV
Resolution 122 eV FWHM at 5.9 keV, 
Count rates > 1,000,000 CPS
A high temperature stage (reflection geometry) for insitu XRD experiments from RT to ~900 K under high vacuum atmosphere (better than 5×10-5 mbar) , temperature stability ~0.5 K and 2θ range up to 100 deg.
Energy range 5 -35 keV
Resolution 122 eV FWHM at 5.9 keV, 
Count rates > 1,000,000 CPS
Linkam stage (transmission geometry)
  1. temperature range from 77 K to 873 K
  2. high heating rate upto 150 K/min
  3. 2θ range of ~40 deg.


1. Investigation of surface structural modifications caused by the influence of the ablative layer in Inconel718 Ni-base superalloy through laser shock peening
Y. V. A., M. Vadani, B. Karan, A. Bhakar, S. Rai, N. Maharjan & A. Bhowmik
Mater. Lett. 354, 135332 (2024).
https://doi.org/10.1016/j.matlet.2023.135332
2. Investigations on ion irradiation induced strain and structural modifications in 3C–SiC
N.Sreelakshmi, Pooja Gupta, Mukul Gupta, V.R. Reddy ,S.K. Rai,C. Da vi, S. Amirthapandian
Material Science in Semiconductor Processing 173, 108170 (2024).
https://doi.org/10.1016/j.mssp.2024.108170
3. Effect of deformation mode on martensitic transformation in medium Mn steel
P. Satyampet, S. Bhunia, S. Kundu & P. Pant
Materialia 34, 102065 (2024)
https://doi.org/10.1016/j.mtla.2024.102065




1. Evading the strength-ductility compromise in medium manganese steel by a novel low temperature warm rolling treatment
A. Chandan, G. Mishra, K. Kishore, G. Bansal, B. Sahoo, P. Jena, S. Kumar, S. Rai, R. Saha, S. Kundu & J. Chakraborty
Mater.Charact. 206, 113445(2023)
https://doi.org/10.1016/j.matchar.2023.113445
2. Anisotropic magnetic and magnetotransport properties in morphologically distinct Nd0. 6Sr0. 4MnO3 thin films
RS Mrinaleni, EP Amaladass, AT Sathyanarayana, S Amirthapandian, J. P, Pooja Gupta, T. Geetha Kumary, S. K. Rai & A. Mani
Physica Scripta 98 (7), 075919 (2023)
https://doi.org/10.1088/1402-4896/acd733
3. Interfacial interaction driven enhancement in the colossal magnetoresistance property of ultra-thin heterostructure of Pr0.6Sr0.4MnO3 in proximity with Pr0.5Ca0.5MnO3
V. Gayathri, E. P. Amaladass, A. T. Sathyanarayana, T. Geetha Kumary, R. Pandian, Pooja Gupta, S. K. Rai & A. Mani
Scientific Reports 13, 2315 (2023)
https://doi.org/10.1038/s41598-023-28314-8
4. Enhanced temperature coefficient of resistance in nanostructured Nd0.6Sr0.4MnO3 thin films.
M. R S, E. P. Amaladass, S. Amirthapandian, A. Sathyanarayana, J. P, K. Ganesan, C. Ghosh, R. M. Sarguna, P. Rao, Pooja Gupta, T. G. Kumary, A. Dasgupta, S. Rai & A. Mani
Thin Solid Films, 779, 139933 (2023)
https://doi.org/10.1016/j.tsf.2023.139933
5. Study of oxidation behaviour of Ruthenium thin film after thermal annealing in oxygen environment
S. Gupta, M. Sinha, R. Dhawan, R. Jangir, A. Bose, Pooja Gupta, M. Swami & M. H. Modi
Thin Solid Films, 764, 139606 (2023)
https://doi.org/10.1016/j.tsf.2022.139606
6. Effect of Chemo-mechanical Polishing on the Surface and Superconducting Properties of Niobium Coupons: A Comparative Study
J Chandra, PN Rao, S Rai, M Manekar
Journal of Superconductivity and Novel Magnetism 36 (3),777-791 (2023).
https://doi.org/10.1007/s10948-023-06499-3




1. Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements
M. A. Alam, M. K. Tiwari, A. Khooha, M. Nayak & C. Mukherjee
Surf. Interface Anal. 54, 1032 (2022)
https://doi.org/10.1002/sia.7128




1. BL-02: a versatile X-ray scattering and diffraction beamline for engineering applications at Indus-2 synchrotron source
Pooja Gupta, PN Rao, MK Swami, A Bhakar, Sohan Lal, SR Garg, CK Garg, PK Gauttam, SR Kane, VK Raghuwanshi, SK Rai,
Journal of Synchrotron Radiation 28 (4), 1193-1201, 2021
2. Line profile analysis of synchrotron X-ray diffraction data of iron powder with bimodal microstructural profile parameters
A Bhakar, P Gupta, PN Rao, MK Swami, P Tiwari, T Ganguli, SK Rai ,
Journal of Applied Crystallography 54 (2), 498-512, 2021


Team members

  1. Dr. S.K. Rai (sanjayrai@rrcat.gov.in)
  2. Dr. Mahesh Kumar Swami
  3. Dr. Pooja Gupta
  4. Dr. Nageswrarao Pothanna
  5. Mr. Ashok Bhakar

Science Highlights

1. Residual stress measurement on inside wall of roll bonded Zircaloy SS pressure tubes used in PHWRs. These samples had diameter of 150 mm, length 200 mm and weight of 12 kg.
Science Highlights
Science Highlights
Stress profile on the inside surface
Photograph of the sample

This work was done in collaboration with RED, BARC.


2. Microstructure assessment of Fe powder using line profile analysis

The super-Lorentzian peak shapes of XRD data of Fe were modeled using convolution of bimodal microstructural parameters. The dislocation densities estimated for narrow and broad profile were about 2×1014 and 2×1015 m-2.

Science Highlights
Science Highlights
Profile fitting of a 200 Bragg peak using convolution of bimodal microstructure.
Comparison of deconvoluted narrow and broad profiles of Bragg peaks of Fe powder using WH plot.

3. Depth dependent stress profile on laser shock peened Ni based super-alloys for aerospace applications
Science Highlights
Science Highlights
Stress profile on sample peened with tape
Stress profile on sample peened without tape

Depth profiling was done by sequential electro-polishing on the alloy samples. These results were matched well with FEM simulations. This work was done in collaboration with Materials Science Engineering department of IIT Delhi.


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