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Government of India | Department of Atomic Energy
Raja Ramanna Centre for Advanced Technology
Synchrotron Utilization Section

Year wise Publications related to SXAL and soft x-ray reflectivity beamline activities
2022
  1. Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity
    Mohammed H. Modi, Shruti Gupta, Praveen K. Yadav, Rajkumar Gupta, Aniruddha Bose, Chandrachur Mukherjee,
    Philippe Jonnard and Mourad Idir J. Synchrotron Rad. 29 978-984 (2022) https://doi.org/10.1107/S1600577522004738

  2. Surface and interface characterization of Ru/C/Ru trilayer structure using grazing incidence X-ray reflectivity and X-ray fluorescence
    Kiranjot, Rajnish Dhawan, Mohammed Hussein Modi,
    Surf. Interface Anal.; 54, 52-58 (2022) https://doi.org/10.1002/sia.7016

2021
  1. Ground calibration of Solar X-ray Monitor on board the Chandrayaan-2 orbiter
    NPS Mithun, SV Vadawale, M Shanmugam, AR Patel, MK Tiwari, M.H. Modi
    et al Experimental Astronomy 51, 33-60 (2021)

  2. Investigation of soft X-ray optical properties and their correlation with structural characteristics of zirconium oxide thin films
    M Sinha, A Singh, R Gupta, AK Yadav, MH Modi
    Thin Solid Films 721, 138552 (2021)

  3. Carbon removal from a mirror-like gold surface by UV light, RF plasma, and IR laser exposure: a comparative study
    P. K. Yadav, R. K. Gupta, A. K. Choubey, S. Ali, U. K. Goutam, and M. H. Modi
    Applied Optics 60, 89-97 (2021) https://doi.org/10.1364/AO.400508

  4. Boron carbide thin films deposited by RF-PECVD and PLD technique: A comparative study based on structure, optical properties, and residual stress
    A Bute, S Jena, S Kedia, DV Udupa, K Singh, D Bhattacharya, MH Modi, N Chand, S Sinha
    Materials Chemistry and Physics 258, 123860 (2021)

  5. Interface modification of Cr/Ti multilayers with C barrier layer for enhanced reflectivity in the water window regime
    P. Sarkar, A. Biswas, N. Abharana, S. Rai, M. H. Modi and D. Bhattacharyya
    J. Synchrotron Rad. 28, 224–230 (2021)

2020
  1. Influence of spin orbit splitting and satellite transitions on nickel soft X-ray optical properties near its L2,3 absorption edge region
    Kiranjot, M. H. Modi, R. K. Gupta, M. Sinha and P. K. Yadav
    J. Synchrotron Rad 27, 1633-1639 (2020) https://doi.org/10.1107/S1600577520011960

  2. Solar X-Ray Monitor on Board the Chandrayaan-2 Orbiter: In-Flight Performance and Science Prospects
    N.P.S. Mithun, Santosh V. Vadawale, Aveek Sarkar, M. Shanmugam, Arpit R. Patel, Biswajit Mondal, Bhuwan Joshi, P. Janardhan,Hiteshkumar L. Adalja, Shiv Kumar Goyal, Tinkal Ladiya, Neeraj Kumar Tiwari1, Nishant Singh, Sushil Kumar, Manoj K. Tiwari3,M.H. Modi, Anil Bhardwaj
    Solar Physics 295, 139 (2020)

  3. Effect of zirconium oxide local structure on soft X-ray optical properties near the oxygen K-edge region
    M. Sinha, R.K. Gupta, Kiranjot, Amol Singh, Mohammed H Modi
    J. Appl. Phys 128, 065302 (2020)

  4. Analysis of polarization characteristics of soft x-ray beam at INDUS-1 reflectivity beamline
    R. K. Gupta, P. K. Yadav, and M. H. Modi
    AIP Conference Proceedings 2265, 030189 (2020) https://doi.org/10.1063/5.0017421

  5. Soft X-ray photon energy calibration using multilayer mirror
    Kiranjot, Mangalika Sinha, R. K. Gupta, P. K. Yadav, and Mohammed H. Modi
    AIP Conference Proceedings 2265, 030196 (2020) https://doi.org/10.1063/5.0017405

  6. Modification of optical properties of magnesium oxide (MgO) thin film under the influence of ambience
    Mangalika Sinha, R. K. Gupta, P. Dasilva, P. Mercere, and Mohammed H. Modi
    AIP Conference Proceedings 2265, 030197 (2020) https://doi.org/10.1063/5.0017048

  7. Analysis of Au film surface after carbon layer removal with ultra violet radiation, RF plasma and IR laser
    P. K. Yadav, R. K. Gupta, A. K. Choubey, Sabir Ali, and M. H. Modi
    AIP Conference Proceedings 2265, 030253 (2020) https://doi.org/10.1063/5.0017399

  8. Interface asymmetry in AlN/Ni and Ni/AlN interfaces: a study using resonant soft x-ray reflectivity
    Kiranjot, R. Dhawan, R.K. Gupta, P. Yadav, Mohammed H Modi
    Applied Surface Science, 529, 147199 (2020)

  9. Interface evolution of Cr/Ti multilayer films during continuous to discontinuous transition of Cr layer"
    P.Sarkar, A. Biswas, S. Rai, H. Srivastava, S. Mandal, M.H. Modi and D. Bhattacharyya
    Vacuum 181, 109610 (2020).

  10. Interfacial Chemistry and Electronic Structure of Epitaxial Lattice-matched TiN/Al0.72Sc0.28N Metal/Semiconductor Superlattices Determined with Soft X-Ray Scattering
    Bidesh Biswas, Sanjay Nayak, Vijay Bhatia, Ashalatha Indiradevi Kamalasanan Pilla, Magnus Garbrecht, M. H. Modi, Mukul Gupta and Bivas Saha
    J. Vac. Sci. Tech. A 38, 053201 (2020)

  11. "Interface evolution of Co/Ti multilayers with ultra-short period"
    P.Sarkar, A. Biswas, S. Ghosh, S. Rai, M.H. Modi and D. Bhattacharyya
    Thin Solid Films 693, 137688 (2020)

2019
  1. Continuous optical constants (δ & β) spectra of aluminium oxide near Al L and O K-edge region,
    M. Sinha, R.K. Gupta, P. Dasilva, P. Mercere, M.H. Modi,
    AIP Conference Proceedings 2115, 030207 (2019).

  2. Depth-resolved compositional analysis of W/B4C multilayers using resonant soft X-ray reflectivity,
    PN Rao, UK Goutam, P Kumar, M Gupta, T Ganguli, SK Rai,
    Journal of synchrotron radiation 26 (3) 2019.

  3. X-ray reflectivity study of growth characteristics of ion beam deposited NbC thin films,
    R Dhawan, SK Rai,
    AIP Conference Proceedings 2115 , 030303 (2019).

  4. Use of zero order synchrotron radiation for in-situ cleaning of beamline optics: Results of trial experiments,
    P.K. Yadav, R.K. Gupta, M.H. Modi,
    AIP Conference Proceedings 2115, 030290 (2019).

  5. A soft x-ray reflectivity beamline for 100-1500 eV energy range at Indus-2 synchrotron radiation source,
    M.H. Modi, R.K. Gupta, S.R. Kane, V. Prasad, C. Kant, P.K. Yadav, V.K. Raghuwanshi., Singh Amol, Sinha M.
    AIP Conf. Proc, 2054, 060022 (2019).

  6. Refurbishing of Au coated toroidal mirror by capacitively coupled RF Plasma discharge,
    Praveen Kumar Yadav, Mukund Kumar, RajKumar Gupta, Mangalika Sinha, J. A Chakera and M. H Modi ,
    Journal of Synchrotron Radiation 26 , 1152-1160 (2019).

  7. Glancing angle soft x-ray reflectivity (SXR) and total electron yield (TEY) characterization of ZrO2 thin film near O K edge,
    Mangalika Sinha, Amol Singh, R.K. Gupta R.K., M.H. Modi,
    AIP Conf. Proc, 2054, 040004, (2019).

  8. Interface Studies of Mo/Si Multilayers with Carbon Diffusion Barrier by Grazing Incidence EXAFS,
    N. Abharana, A. Biswas, P. Sarkar, P. Rajput, Rajnarayan De, K.D. Rao, M.H. Modi, D. Bhattacharyya, S.N. Jha and N.K. Sahoo
    Thin solid films 673, 126-135 (2019).

  9. Investigation of the buried planar interfaces in multi-layered inverted organic solar cells using X-ray reflectivity and impedance spectroscopy,
    Shashi Srivastava, Mohammed H. Modi, Sajal Ghosh, Samarendra Singh,
    J. Phys.: Condens. Matter 31,124003 (2019).

2018
  1. Studies on thin films & multilayers using soft x-ray reflectivity beamlines at Indus synchrotron sources,
    M.H. Modi, R.K. Gupta, P.K. Yadav,
    Physics News, bulletin of the Indian physics association, 48, p. 70, (2018).

  2. Thermal and temporal stability of W∕B4C multilayer mirrors for space-based astronomical applications,
    Panini S. Singam, Maheswer Nayak, Rajkumar Gupta, Paresh C. Pradhan, Arindam Majhi, Shyama Narendranath, and Parameswaran Sreekumar,
    J. Astron. Telesc. Instrum. Syst. 4(4), 044003 (2018).

  3. Influence of core-hole effect on optical properties of Magnesium Oxide (MgO) near Mg L edge region ,
    Mangalika Sinha, Mohammed H Modi, Haranath Ghosh, P.K. Yadav, R.K. Gupta,
    J. Synchrotron. Rad. 25, 1-6 (2018).

  4. Optical performance of W/B C multilayer mirror in 4 the soft x-ray region,
    P. C. Pradhan, A. Majhi and M. Nayak,
    J. Appl. Phys., 123, 095302 (2018).

  5. Study of soft x-ray optical properties of niobium carbide (NbC) thin film in 6 – 15 nm wavelength region ,
    Amol Singh, Mangalika Sinha, Mohammed H Modi,
    Vacuum, 155, 60-63 (2018).

  6. Depth analysis of Al/ZrC interfaces using SIMS and x-ray reflectivity techniques ,
    Mohammed H. Modi, Mangalika Sinha, Aniruddha Bose, Amol Singh, Philippe Jonnard ,
    Surf. Interface Anal.;; 2018 DOI: 10.1002/sia.6443.

  7. Study of the Au-Cr bilayer system using x-ray reflectivity, GDOES and ToF-SIMS ,
    Philippe Jonnard, Mohammed H. Modi, Karine Le Guen, Nargish Aneshwari, Mangalika Sinha, Mourad Idir, Patrick Chapon, Anouk Galtayries,
    Surf. Interface Anal.;; 2018 DOI: 10.1002/sia.6445

  8. Soft x-ray characterization of ion beam sputtered Magnesium oxide (MgO) thin film ,
    Mangalika Sinha, Mukul Gupta, Philippe Jonnard, Mohammed H. Modi,
    Surf. Interface Anal.; 2018 DOI: 10.1002/sia. 6446.

  9. Investigation of composition of boron carbide thin films by resonant soft x-ray reflectivity ,
    PN Rao, RK Gupta, K Saravanan, A Bose, SC Joshi, T Ganguli, SK Rai,
    Surface and Coatings Technology 334, 536-542 (2018).

  10. Refurbishing of Carbon Contaminated Pre-Mirror of Reflectivity beam line at Indus-1,
    P.K. Yadav, M. Kumar, R.K. Gupta, M. Sinha, H.S Patel and M.H. Modi,
    AIP Conf. Proc. 1942, 080052 (2018).

  11. Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials,
    A Majhi, M Nayak, PC Pradhan, EO Filatova, A Sokolov, F Schäfers,
    Scientific reports 8 , 15724 (2018).

  12. Study of lamellar multilayer grating near B K-edge and Si L-edge,
    PC Pradhan, M Nayak,
    Indian Journal of Physics 92, 1299-1306 (2018).

2017
  1. Depth resolved compositional analysis of aluminium oxide thin film using non-destructive soft x-ray reflectivity technique,
    Mangalika Sinha, Mohammed H. Modi,
    Applied Surface Science, 419, 311-318 (2017).

  2. Investigation on depth resolved compositions of e-beam deposited ZrO2 thin film,
    Amol Singh, Mangalika Sinha, R.K. Gupta, Mohammed H. Modi,
    Applied Surface Science, 419, 337-341 (2017).

  3. Structural variation in a synchrotron-induced contamination layer (a-C:H) deposited on a toroidal Au mirror surface,
    P. K. Yadav, R. K. Gupta, M. K. Swami & M. H. Modi,
    J. Synchrotron Rad. 24, (2017). https://doi.org/10.1107/S1600577517007123

  4. Investigation of ZrC/Al interfaces in a Al/ZrC/Al/W waveguide-like structure by soft X-ray reflectivity technique,
    Amol Singh, Mohammed H. Modi, P. Jonnard, K. Le Guen, J.-M. André,
    J. Electron. Spectrosc. Relat. Phenom., 220, 6-8 (2017).

  5. Mangalika Sinha, M.H. Modi,
    X-ray reflectivity and photoelectron spectroscopy study of aluminum oxide thin film,
    AIP Conference Proceedings, 1832, 080025, (2017).

  6. Amol Singh, M.H. Modi, Dhawan R, P. Jonnard, K. Le Guen, and J.-M. André,
    Study of complex waveguide structure using soft X-ray reflectivity technique,
    AIP Conference Proceedings, 1832, 080093, (2017)

  7. P. Sarkar Roy, A. Biswas, Debarati Bhattacharya, R. K. Sharma, M.H. Modi, S.K. Rai, D. Bhattacharyya, N. K. Sahoo,
    Development and characterization of soft X-ray synchrotron mirror,
    AIP Conference Proceedings, 1832, 060011, (2017).

  8. Performance of Co/Ti multilayers in a water window soft x-ray regime,
    Piyali Sarkar, Arup Biswas, Rajnarayan De, K. Divakar Rao, Subir Ghosh, M. H. Modi, Siju John, H. C. Barshilia, Dibyendu Bhattacharyya, and Naba Kishor Sahoo,
    Applied Optics, 56, 7525-7532 (2017).

2016
  1. Ex-situ characterization of synchrotron radiation induced carbon contamination on LiF window,
    P. Yadav, M.H. Modi, M.K. Swami, P. J. Singh,
    J. Electron. Spectrosc. Relat. Phenom., 211, 64-69 (2016).

  2. Optical constants of e-beam-deposited zirconium dioxide measured in the 55–150 Å wavelength region using the reflectivity technique,
    Amol Singh, Mangalika Sinha, R. K. Gupta, and Mohammed H. Modi,
    Applied Optics 55, 3170 (2016).

  3. Optical constants of mixed phase aluminum oxide thin film in 60-200å soft x-ray/extreme ultraviolet region,
    Mangalika Sinha, Saurabh Sharma, Amol Singh, Mohammed H. Modi,
    Jpn. J. Appl. Phys. 55, 101101 (2016).

  4. Microstructure and composition analysis of low-Z/low-Z multilayers by combining hard and resonant soft X-ray reflectivity,
    P. N. Rao, S. K. Rai, A. K. Srivastava, T. Ganguli, R. Dhawan, and P. A. Naik,
    J. Appl. Phys. 119, 245301 (2016).

  5. Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 å wavelength region,
    Saurabh Sharma, R.K. Gupta, Mangalika Sinha, P. Yadav, A. Singh, Mohammed H. Modi,
    AIP Conf. Proc. 1731, 08001 (2016).

2015
  1. Influence of structural disorder on soft x-ray optical behavior of NbC thin films,
    Amol Singh, Mohammed H. Modi, P. Rajput, A.K. Sinha, G.S. Lodha,
    J. Appl. Phys., 117, 175301 (2015).

  2. Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications,
    Amol Singh, Mohammed H. Modi, A.K. Sinha, R. Dhawan, G.S. Lodha ,
    Surface and Coatings Technology, 272, 409-414 (2015).

  3. Optical properties of zirconium carbide in 60-200Å wavelength region using reflectivity technique,
    Amol Singh, Mohammed H. Modi, G.S. Lodha,
    Applied Optics, 54, 253 (2015).

  4. Evaluation of structural and microscopic properties of tetragonal ZrO2 for the facet coating of 980 nm semiconductor laser diodes,
    V.K. Dixit, A. Marathe, G. Bhatt, S.K. Khamari, K. Rajiv, R. Kumar, C. Mukherjee, C. J. Panchal, T. K. Sharma and S. M Oak,
    J. Phys. D: Appl. Phys. 48 105102 (2015).

  5. Stability and normal incidence reflectivity of W/B4C multilayer mirror near the boron K absorption edge,
    P. N. Rao, S. K. Rai, M. Nayak, and G. S. Lodha,
    Applied Optics, 52, 6126 (2015).

  6. Removal of carbon contaminations by RF plasma generated reactive species and subsequent effects on optical surface,
    P. K. Yadav, M. Kumar, S. K. Rai, M. H. Modi, J. A. Chakera, M. Nayak, P. A. Naik and G. S. Lodha,
    AIP Conf. Proc. 1665, 080062 (2015).

  7. Study of NbC thin films for soft X-ray multilayer applications,
    Amol Singh, Mohammed. H. Modi, Parasmani Rajput, S. N. Jha and G. S. Lodha,
    AIP Conf. Proc. 1665, 080008 (2015)

2014
  1. Analysis of higher harmonic contamination with a modified approach using a grating analyser,
    R.K. Gupta, Mohammed H. Modi, M. Kumar, J. A. Chakera, and G.S. Lodha ,
    Rev. Sci. Instrum., 85, 043107 (2014).

  2. Study of growth kinetics and depth resolved composition of a-SiNx:H thin films by Resonant Soft X-Ray Reflectivity at the Si-L2,3 edge,
    R. K. Bommali, M. H. Modi, S. Zhou, S. Ghosh and P. Srivastava,
    Applied Surface Science, 305, 173-178 (2014).

  3. Structure and composition of zirconium carbide thin-film grown by ion beam sputtering for optical applications,
    Amol Singh, Mohammed H. Modi, Rajnish Dhawan, and G. S. Lodha,
    AIP Conf. Proc. 1591, 869 (2014).

  4. Comparison of Mo/Si and NbC/Si lamellar multilayer gratings near Si absorption edge,
    Ankita Niranjan, Mohammed H. Modi, Amol Singh, Mourad Idir, and G. S. Lodha,
    AIP Conf. Proc. 1591, 687 (2014).

  5. Study on higher harmonic suppression using edge filter and polished Si wafer,
    R. K. Gupta, Amol Singh, Mohammed H. Modi, and G. S. Lodha , AIP Conf. Proc. 1591, 988 (2014).

2013
  1. Study on effective cleaning of gold layer from fused silica mirrors using nanosecond pulsed Nd:YAG laser ,
    Ambar Choubey, Amol Singh, M.H. Modi, B.N. Upadhyaya, G.S. Lodha, S.M. Oak,
    Applied Optics, 52, 7540 (2013).

  2. Cleaning of Carbon Layer from the Gold Films Using a Pulsed Nd:YAG Laser,
    Amol Singh, Ambar Choubey, Mohammed H. Modi, B.N. Upadhyaya, S. M. Oak, G.S. Lodha and S. K. Deb,
    Applied Surface Science, 283, 612– 616 (2013)

  3. A combined electron-ion spectrometer for studying complete kinematics of molecular dissociation upon shell selective ionization,
    K. Saha, S. B. Banerjee, and B. Bapat,
    Rev. Sci. Instrum. 84, 073101 (2013)

  4. Three body dissociation of CS2+ 2 subsequent to various S(2p) Auger transitions,
    K. Saha, S. B. Banerjee, and B. Bapat,
    The Journal Of Chemical Physics 139, 164309 (2013).

  5. Stability and normal incidence reflectivity of W/B4C multilayer mirror near the boron K absorption edge,
    P. N. Rao, S. K. Rai, M. Nayak, and G. S. Lodha,
    Applied Optics 52, 6126 (2013).

  6. Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity,
    Maheswar Nayak and G. S. Lodha,
    Journal of Applied Physics, 114 023505 (2013).

  7. Restoration of absolute diffraction efficiency and blaze angle of carbon contaminated gratings by UV cleaning,
    M. Kumar, M. H. Modi, H. Singhal, S. Raja, J. Chakera, R.K. Gupta, P. A. Naik, G. S. Lodha, and P. D. Gupta,
    Applied Optics 52, 1725 (2013).

  8. Thermal stability studies of ion beam sputter deposited C/B4C x-ray multilayer mirror,
    N. Pothana, M.H. Modi, S. Rai, V. Sathe, G.S. Lodha, S.K. Deb ,
    Thin Solid Films, 527, 244-249 (2013).

  9. Role ofradiativedecayofvalenceplasmonsintransmissionspectra of Si,SiNx and PET membranes,
    P.K. Yadav, R.K.Gupta, M.H.Modi, ShailendraKumar,
    Solid State Communications 156, 12-15 (2013).

  10. Growth of Multilayer Optics for Synchrotron Radiation Sources,
    P N Rao, M Nayak, M H Modi, S K Rai and G S Lodha,
    J. Phys.: Conf. Ser. 425 052023 (2013).

  11. Study on effective laser cleaning method to remove carbon layer from a gold surface,
    Amol Singh, A K Choubey, Mohammed H Modi, B N Upadhyaya and G S Lodha,
    J. Phys.: Conf. Ser. 425, 152020 (2013).

  12. Role of valence plasmons in transmission of photons through mica membrane in energy range 10-40eV,
    P. K. Yadav, Shailendra Kumar, R. K. Gupta, M. H. Modi, Pragya Tiwari, G. S. Lodha, and S. K. Deb,
    AIP Conf. Proc. 1512, 116 (2013).

  13. Analysis of soft x-ray/VUV transmission characteristics of Si and Al filters,
    Aby Joseph, Mohammed H. Modi, Amol Singh, R. K. Gupta, and G. S. Lodha,
    AIP Conf. Proc. 1512, 498 (2013).
2012
  1. NbC/Si multilayer mirror for next generation EUV light sources,
    Mohammed H. Modi, SK Rai, Mourad Idir, Franz Schaefers, G.S. Lodha, Optics Express 20, 15114-15120 (2012).

  2. Quantitative determination of higher harmonic contents in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer,
    Mohammed H. Modi, R.K. Gupta, Amol Singh, G.S. Lodha,
    Applied. Optics. 51, 3552-3557 (2012).

  3. Fabrication and evaluation of large area Mo/Si soft x-ray multilayer mirrors at Indus SR facilities,
    P. N.Rao, M. Nayak, G. S. Lodha, S. K. Rai, A.K. Srivastava, M. H. Modi, A. Sagdeo,
    Advances in Optical Technologies.Article ID 976868, 8 pages (2012).

  4. Fine structures in refractive index of sapphire at the LII,III absorption edge of Aluminum determined by soft x-ray ,
    Arijeet Das, R.K.Gupta, M.H.Modi, C.Mukherjee1, S.K.Rai, Tapas Ganguli, G.S.Lodha and S.K.Deb,
    Applied Optics 51, 7402-7410 (2012).

  5. Application of multilayer mirror for harmonic analysis in soft X-ray region,
    Mohammed H. Modi, R. K. Gupta, and G. S. Lodha,
    AIP Conf. Proc. 1447, 507 (2012).

  6. Analysis of order contamination from toroidal grating monochromator of Indus-1 reflectivity beamline,
    R. K. Gupta, Mohammed H. Modi, and G. S. Lodha,
    AIP Conf. Proc. 1447, 513 (2012).

  7. Measurement of absolute diffraction efficiency of a variable line spaced grating using reflectivity beamline,
    M. Kumar, M. H. Modi, H. Singhal, J. A. Chakera, R. K. Gupta, P. A. Naik, G. S. Lodha, and P. D. Gupta,
    AIP Conf. Proc. 1447, 687 (2012).

  8. Magnetron sputtering system for fabrication of x-ray multilayer optics,
    M. Nayak, P. N. Rao and G. S. Lodha,
    AIP Conf. Proc. 1451, 154 (2012)

  9. Probing spectroscopic like information using resonant scattering,
    M. Nayak, and G. S. Lodha,
    AIP Conf. Proc. 1451, 55 (2012).

  10. Fabrication and evaluation of large area soft x-ray multilayer mirrors,
    P. N. Rao, M. Nayak, G. S. Lodha, S. Rai, A. K. Srivastava, M. H. Modi and A. Sagdeo,
    AIP Conf. Proc. 1451, 151 (2012).

2011
  1. Study of micro roughness parameters and growth characteristics of NbC/Si multilayer using layer by layer power spectral density analysis,
    Mohammed H. Modi, G. S. Lodha, M. Thomasset, and Mourad Idir,
    AIP Proceeding 1349, 715, (2011).

  2. Effect of soft x-ray/VUV illumination on soft matter thin film,
    S. R. Naik, M. H. Modi, P. Pandit, G. S. Lodha, and A. Gupta,
    AIP Proceeding 1349, 701, (2011).

  3. Si-rich a-SiNx:H thin film a prospective material for EUV lithography: An optical response near Si L2,3-edge,
    S.P. Singh, Mohammed H. Modi, and P. Srivastava,
    AIP Proceeding 1349, 667, (2011).

  4. Qualitative estimation of Si-rich a-SiNx:H thin film composition by soft X-ray reflectivity analysis,
    S. P. Singh, Mohammed H. Modi, and P. Srivastava,
    AIP Proceeding 1349, 665, (2011).

  5. Study of the optical response of Si-rich a-SiNx:H thin film near Si L2,3 -edge using soft x-ray reflectivity,
    S. P. Singh, Mohammed Hussein Modi and P Srivastava,
    J. Phys. D: Appl. Phys. 44, 215501(2011).

  6. Optical response near the soft x-ray absorption edges and structural studies of low optical contrast system using soft x-ray resonant reflectivity,
    M. Nayak, G. S. Lodha,
    Journal of Atomic, Molecular and Optical Physics (2011). doi:10.1155/2011/649153.
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